Inspec keywords: error correction codes; SRAM chips; error detection codes; CMOS memory circuits; radiation hardening (electronics); nanoelectronics; parity check codes

Other keywords: electronic systems; nanometer devices; radiation induced soft errors; adjacent error detection performance; CMOS process technology; high performance adjacent error detection; radiation particle; static random-access memory; error correction codes; Euclidean geometry-low density parity check code; SRAM; radiation effects; ECC; soft error mitigation

Subjects: Memory circuits; CMOS integrated circuits; Semiconductor storage; Codes; Radiation effects (semiconductor technology)