Inspec keywords: integrated circuit design; SRAM chips; MOSFET; low-power electronics

Other keywords: access path; high-speed 13T SRAM cell; parameter fluctuations; ST11T cell; transmission gates; device-performance variability mitigation; power reduction; gate scalability; FinFET transistor structure; low-power static-random access memory cell; short channel effects; intrinsic body; leakage current; fin field-effect transistors; propagation delay; power gating technique; planar complementary MOS technology; gate controllability; dopant ions; sleep transistors approach; speed improvement; enhancement methods; performance analysis; power dissipation

Subjects: Digital circuit design, modelling and testing; Memory circuits; Semiconductor storage; Insulated gate field effect transistors