Inspec keywords: organic compounds; scanning electron microscopy; semiconductor growth; porous semiconductors; II-VI semiconductors; transmission electron microscopy; visible spectra; nanoporous materials; wide band gap semiconductors; zinc compounds; nanosensors; gas sensors; annealing; nanofabrication; ultraviolet spectra; focused ion beam technology

Other keywords: annealing; one-pot wet-chemical method; temperature 293 K to 298 K; focused ion beam technology; nanosheets; high-resolution transmission electron microscopy; UV-activated room temperature single-sheet ZnO gas sensor; ZnO; ethanol; single-sheet porous single-crystalline zinc oxide sheet; time 2 h; scanning electron microscopy; UV-visible spectrum

Subjects: Nanofabrication using crystal growth techniques; Powders and porous materials (engineering materials science); Nanometre-scale semiconductor fabrication technology; Low-dimensional structures: growth, structure and nonelectronic properties; Optical properties of II-VI and III-V semiconductors (thin films, low-dimensional and nanoscale structures); II-VI and III-V semiconductors; Annealing processes; Structure of solid clusters, nanoparticles, nanotubes and nanostructured materials; Chemical sensors; Microsensors and nanosensors; Visible and ultraviolet spectra of II-VI and III-V semiconductors; Structure of powders and porous materials; Annealing processes in semiconductor technology; Chemical sensors