Inspec keywords: hot carriers; annealing; semiconductor device reliability; CMOS integrated circuits; MOSFET circuits; radiation hardening (electronics)

Other keywords: enclosed gate layouts; HCE damage; NMOSFET; CMOS technology; CMOS circuits; total-dose radiation tolerance; size 65.0 nm; complementary metal-oxide-semiconductor technology; N-channel metal-oxide-semiconductor field effect transistors; annealing bias; enclosed gate NMOSFET; two-edged gate layouts; constant voltage stress; cold carrier contribution; hot carrier stress; hot carrier reliability; two-edged gate NMOSFET

Subjects: CMOS integrated circuits; Radiation effects (semiconductor technology); Annealing processes in semiconductor technology; Reliability; Insulated gate field effect transistors