Inspec keywords: FIR filters; radiation hardening (electronics); residue number systems

Other keywords: redundant residue number system; FIFO; low-cost fault-tolerant finite impulse response filter; Chinese remainder theorem; single event upset; small-sized first-in–first-out; SEU; RRNS; three-moduli set residue to binary converter; fault-tolerant FIR filter; CRT; rollback operations; logic resources; fault injections; RTBC; soft errors

Subjects: Digital arithmetic methods; Digital filters; Digital filters; Radiation effects (semiconductor technology)