Inspec keywords: flash memories; current-mode circuits; embedded systems; circuit feedback; amplifiers

Other keywords: double sensing margin; storage capacity 1 Mbit; precharge acceleration scheme; random address transitions; embedded flash memory; OC-CSA; precharge time reduction; novel offset-cancelling current-mode sense amplifier; size 130.0 nm; fast-read eFlash memory; eFlash macro; sensing speed; time 11.0 ns; positive feedback techniques; voltage 1.3 V

Subjects: Amplifiers; Memory circuits; Semiconductor storage