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IEE Proceedings - Computers and Digital Techniques

Volume 149, Issue 1, January 2002

Volume 149, Issue 1

January 2002

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    • Removing multiple redundancies in combinational circuits
      E-BIST: enhanced test-per-clock BIST architecture
      Design of efficient architectures for discrete orthogonal transforms using bit level systolic structures
      Code compression techniques using operand field remapping

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