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IEE Proceedings - Circuits, Devices and Systems

Volume 153, Issue 4, August 2006

Volume 153, Issue 4

August 2006

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    • Pseudo-random sequence generators with improved inviolability performance
      Accelerating reconfiguration of degradable VLSI arrays
      IOC-LP: hybrid test data compression/decompression scheme for low power testing
      Low-complexity bit-parallel systolic architectures for computing A(x)B2(x) over GF(2m)

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