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Online ISSN 1751-861X Print ISSN 1751-8601
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IET Computers & Digital Techniques

Volume 9, Issue 4, July 2015


Volume 9, Issue 4

July 2015

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    • Editorial
      Mastering CMOS variability is the key to success
      Defect avoidance in programmable devices
      Fighting stochastic variability in a D-type flip-flop with transistor-level reconfiguration
      Algebra of switching networks
      Extending standard cell library for aging mitigation
      Probabilistic model for nanocell reliability evaluation in presence of transient errors
      Yield-driven design-time task scheduling techniques for multi-processor system on chips under process variation: a comparative study
      Reliable computation with unreliable computers
      Erratum

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