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IET Computers & Digital Techniques

Volume 11, Issue 3, May 2017


Volume 11, Issue 3

May 2017

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    • Reconstruction of a functional test sequence for increased fault coverage
      Metric for the ability of functional capture cycles to ensure functional operation conditions
      FPGA implementation of hardware efficient adaptive filter robust to impulsive noise
      Fast and accurate circuit delay model for FPGA architectural exploration

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