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Online ISSN 1350-911X
Print ISSN 0013-5194

Electronics Letters is an internationally renowned peer-reviewed rapid-communication journal that publishes short original research papers every two weeks. Its broad and interdisciplinary scope covers the latest developments in all electronic engineering related fields including communication, biomedical, optical and device technologies. Electronics Letters also provides further insight into some of the latest developments through special features and interviews.


Impact Factor: 0.854
5-year Impact Factor: 0.914 
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SJR: 0.549

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Highlights from the issue

Good transmission

Researchers from the Tokyo Institute of Technology have built on work, previously published in Electronics Letters in 2012 (Ishigaki, K., Shiraishi, M., Suzuki, S., Asada, M, Nishiyama, N., and Arai, S.: ‘Direct intensity modulation and wireless data transmission characteristics of terahertz-oscillating resonant tunnelling diodes’, Electron. Lett., vol. 48, no. 10, pp. 582–583, 2012), in the field of THz communication and resonant tunnelling diodes. They have increased the cut-off, improved performance at room temperature, and reduced the device's size.Read more..

Interview with Sofiane Achiche

Professor Sofiane Achiche of Ecole Polytechnique de Montreal, Canada, talks to us about the work behind the paper ‘Detecting muscle contractions using strain gauges.Read more...

Recent highlights

Building an Image

Image stitching software is an exciting technology with many applications such as smart phones and satellites. It is used to create panoramic and high-resolution images. Image stitching is often performed through the use of computer software and works using overlaps between images with identical exposures. This approach can create seamless images. However some approaches use software that makes use of different exposures at the edge of the overlapping region. Electronics Letters spoke to Wuxia Yan, from the Nanjing University of Science and Technology in China and who is the co-author of the featured letter, to find out more.  Read more..

Interview with Vincent Savaux

Dr. Vincent Savaux from b<>com Institute of Research and Technology, France, talks to us about the work behind the paper ‘Optimal non-outage probability maximizing the outage rate in Rayleigh channel’.Read more...

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