Dual-edge triggered JK flip-flop with comprehensive analysis in quantum-dot cellular automata

Yongqiang Zhang; Guangjun Xie; Hongjun Lv

Dual-edge triggered JK flip-flop with comprehensive analysis in quantum-dot cellular automata

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Author(s): Yongqiang Zhang¹ ; Guangjun Xie¹ ; Hongjun Lv¹
- Affiliations: 1: School of Electronic Science and Applied Physics, Hefei University of Technology , Hefei 230009 , People's Republic of China
Source: Volume 2018, Issue 7, July 2018, p. 354 – 359
DOI: 10.1049/joe.2018.0138 , Online ISSN 2051-3305

This is an open access article published by the IET under the Creative Commons Attribution License (http://creativecommons.org/licenses/by/3.0/)

Received 20/03/2018, Accepted 06/04/2018, Published 10/04/2018

Quantum-dot cellular automata (QCA), a new computing paradigm at nanoscale, may be a prospective substitution of conventional complementary metal oxide semiconductor (CMOS)-based integrated circuits. A new dual-edge triggered JK flip-flop based on a novel dual-edge triggered structure with less fundamental building gates is proposed in QCA domain in this study. To get a more robust triggered structure, the probabilistic transfer matrix is employed to analyse the reliability of the structure. The functionalities of the dual-edge triggered structure and JK flip-flop are verified with QCADesigner, a simulation tool widely used. By arranging the clock zones serially and QCA cells logically, compared with previous circuits, both of the proposed triggered structure and JK flip-flop perform well in terms of cells count, area, complexity, QCA cost and power dissipation at different tunnelling energy levels at 2 K temperature, respectively.

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Dual-edge triggered JK flip-flop with comprehensive analysis in quantum-dot cellular automata

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