access icon openaccess Device and circuit performance analysis of double gate junctionless transistors at L g = 18 nm

The design and characteristics of double-gate (DG) junctionless (JL) devices are compared with the DG inversion-mode (IM) field effect transistors (FETs) at 45 nm technology node with effective channel length of 18 nm. The comparison are performed at iso-V th for both n- and p-type of devices. The JL device shows lower drain-induced barrier lowering, steep subthreshold slope and lower OFF state current. For the first time, the authors demonstrate a pass gate (PG) logic, inverter circuit and static random access memory (SRAM) stability analysis using JL devices, rather than a complementary metal-oxide semiconductor (CMOS) configuration. They observed that transient response of JL PG configuration is similar to that of conventional CMOS PGs. JL inverter also shows similar transient characteristics with 25% reduction in delay and 12% improvement in 6 T SRAM cell stability compared with IMFETs, which shows large potential in digital circuit applications. The simulations were performed using coupled device-circuit methodology in ATLAS technology aided computer design (TCAD) mixed-mode simulator.

Inspec keywords: technology CAD (electronics); transient response; invertors; semiconductor device models; field effect transistors; CMOS integrated circuits; SRAM chips

Other keywords: inverter circuit; static random access memory; double gate junctionless transistors; lower OFF state current; steep subthreshold slope; DG inversion-mode FETs; SRAM cell stability; coupled device-circuit methodology; ATLAS TCAD mixed-mode simulator; CMOS configuration; complementary metal-oxide semiconductor configuration; transient response; pass gate logic; drain-induced barrier lowering; field effect transistors

Subjects: Insulated gate field effect transistors; Semiconductor device modelling, equivalent circuits, design and testing; CMOS integrated circuits; Semiconductor integrated circuit design, layout, modelling and testing; Computer-aided circuit analysis and design; Memory circuits; Power electronics, supply and supervisory circuits

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