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Measurement of differential-mode and common-mode scattering parameters of symmetric coupled-line discontinuity structure

Measurement of differential-mode and common-mode scattering parameters of symmetric coupled-line discontinuity structure

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  • Author(s): C.-H. Tseng 1  and  T.-G. Ma 2
    • View affiliations
    • Affiliations: 1: Department of Electronic Engineering, National Taiwan University of Science and Technology, Taipei, Taiwan, Republic of China
      2: Department of Electrical Engineering, National Taiwan University of Science and Technology, Taipei, Taiwan, Republic of China
  • Source: Volume 2, Issue 3, April 2008, p. 242 – 247
    DOI:  10.1049/iet-map:20060347 , Print ISSN 1751-8725, Online ISSN 1751-8733
© The Institution of Engineering and Technology
Published

The coupled-line thru-reflection-line (TRL) calibration technique is developed to measure the differential-mode (DM) and common-mode (CM) scattering parameters of the symmetric coupled-line discontinuity structure. Under DM and CM excitation conditions, a four-port symmetric coupled-line network can be treated as equivalent DM and CM two-port half-circuits. The developed coupled-line TRL calibrators can also be equivalent to DM and CM half-calibrators, and then applied to measure the DM and CM scattering parameters of the symmetric coupled-line discontinuity structure. To validate the effectiveness of the developed measurement method, the DM and CM characteristics of a coupled-line guided-wave structure, the periodically non-uniform coupled microstrip-line structure, are measured over the frequency range of 1–8 GHz. The measured results are shown in reasonable agreement with the simulated results. It demonstrates that the developed coupled-line TRL technique is an effective approach to characterise the symmetric coupled-line discontinuity structure.

Inspec keywords: electromagnetic coupling; electromagnetic wave scattering; microstrip lines

Other keywords: coupled-line guided-wave structure; DM excitation conditions; microstrip lines; CM excitation conditions; symmetric coupled-line discontinuity structure; thru-reflection-line calibration; two-port half-circuits; coupled-line TRL calibration technique; differential-mode scattering parameters; common-mode scattering parameters

Subjects: Electromagnetic wave propagation; Waveguides and microwave transmission lines

References

    1. 1)
      • D.E. Bockelman , W.R. Eisenstandt . Calibration and verification of the pure-mode vector network analyzer. IEEE Trans. Microw. Theory Tech. , 7 , 1009 - 1012
    2. 2)
      • ‘Agilent E5070B/E5071B ENA series RF network analyzers user's guide’ (Agilent Technologies Japan, Ltd., 2002).
    3. 3)
      • W.R. Eisenstandt , D.E. Bockelman . Common and differential crosstalk characterization on the silicon substrate. IEEE Microw. Guid. Wave Lett. , 1 , 25 - 27
    4. 4)
      • K.C. Gupta , R. Garg , I. Bahl , P. Bhartia . (1996) Microstrip lines and slotlines.
    5. 5)
      • S. Sun , L. Zhu . Periodically nonuniform coupled microstrip-line filters with harmonic suppression using transmission zero reallocation. IEEE Trans. Microw. Theory Tech. , 5 , 1817 - 1822
    6. 6)
      • H.J. Eul , B. Schiek . A generalized theory and new calibration procedures for network analyzer self-calibration. IEEE Trans. Microw. Theory Tech. , 4 , 724 - 731
    7. 7)
      • S. Sun , L. Zhu . Guided-wave characteristics of periodically nonuniform coupled microstrip lines–even and odd modes. IEEE Trans. Microw. Theory Tech. , 4 , 1221 - 1227
    8. 8)
      • L. Li , K. Wu , L. Zhu . Numerical TRL calibration technique for parameter extraction of planar integrated discontinuities in a deterministic MOM algorithm. IEEE Microw. Wirel. Compon. Lett. , 12 , 485 - 487
    9. 9)
      • ‘Applying the 8510 TRL calibration for non-coaxial measurements’ (Agilent product note 8510-8A 2000).
    10. 10)
      • H.C. Lu , T.H. Chu . Port reduction methods for scattering matrix measurement of an N-port network. IEEE Trans. Microw. Theory Tech. , 6 , 956 - 968
    11. 11)
      • D.E. Bockelman , W.R. Eisenstandt . Combined differential and common-mode analysis of power splitters and combiners. IEEE Trans. Microw. Theory Tech. , 11 , 2627 - 2632
    12. 12)
      • R. Mongia , I. Bahl , P. Bhartia . (1999) RF and microwave coupled-line circuits.
    13. 13)
      • G.F. Engen , C.A. Hoer . Thru-reflection-line: an improved technique for calibrating the dual six-port automatic network analyzer. IEEE Trans. Microw. Theory Tech. , 12 , 987 - 993
    14. 14)
      • D.E. Bockelman , W.R. Eisenstandt . Pure-mode network analyzer for on-wafer measurements of mixed-mode S-parameters of differential circuits. IEEE Trans. Microw. Theory Tech. , 7 , 1071 - 1077
    15. 15)
      • D.E. Bockelman , W.R. Eisenstandt . Combined differential and common-mode scattering parameters: theory and simulation. IEEE Trans. Microw. Theory Tech. , 7 , 1530 - 1539
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