access icon free Constitutive parameters extraction for thin two-dimensional cylinders based on scattering field measurements

This study presents an analytical method for extracting the constitutive parameters of an isotropic two-dimensional magneto-dielectric thin cylinder (small radius compared with the wavelength). The method is based on the scattered far field information to a plane wave illumination. Three variations of the method are presented. First, the complex monostatic scattered fields of two orthogonal polarisations are used to extract the complex constitutive parameters (permittivity and permeability) of a lossy cylinder. Second, the complex bistatic and monostatic scattered fields for a single polarisation are used to extract the complex permittivity and permeability. Third, the absolute value of the monostatic radar cross section for two orthogonal polarisations is used to extract the complex permittivity or permeability. An approximation for a small argument is used to obtain a simple polynomial expression for the scattered field to extract the constitutive parameters. Numerical examples to validate the proposed extraction methods are shown and the results are satisfactory.

Inspec keywords: electromagnetic wave polarisation; electromagnetic wave scattering; permittivity; magnetic permeability

Other keywords: scattered far field information; monostatic scattered fields; orthogonal polarisations; complex monostatic scattered fields; simple polynomial expression; complex permeability; isotropic two-dimensional magneto-dielectric thin cylinder; plane wave illumination; complex constitutive parameter extraction method; thin two-dimensional cylinders; complex bistatic scattered fields; scattering field measurements; complex permittivity; lossy cylinder

Subjects: Electromagnetic wave propagation; Electromagnetic waves: theory

References

    1. 1)
    2. 2)
      • 12. Lipschutz, S., Murray, S., Liu, J.: ‘Schaum's Outline of Mathematical Handbook of Formulas and Tables’, Ed. 4th, Schaum's Outline Series.
    3. 3)
    4. 4)
    5. 5)
      • 8. Kent, G.: ‘Dielectric resonances for measuring dielectric properties’, Microw. J., 1988, 31, (10), pp. 90114.
    6. 6)
    7. 7)
      • 9. Lynch, A.: ‘Measurement of dielectric properties in an open resonator’. Proc. IEE Conf. on Dielectric Materials Measurements and Applications, Institute of Electrical Engineers, London, 1979, vol. 177, pp. 373376.
    8. 8)
      • 1. Chen, L., Ong, C., Neo, C., Varadan, V.K., Varadan, V.K.: ‘Microwave electronics: measurement and materials characterization’ (Wiley, 2004).
    9. 9)
      • 13. Balanis, C.A.: ‘Advanced engineering electromagnetics’ (Wiley, New York, 1989), ch. 11.
    10. 10)
    11. 11)
      • 7. Damaskos, N.: ‘Measuring dielectric constants of low loss materials using a broadband cavity technique’, Microw. J., 1995, 38, (9), pp. 140149.
    12. 12)
    13. 13)
http://iet.metastore.ingenta.com/content/journals/10.1049/iet-map.2013.0714
Loading

Related content

content/journals/10.1049/iet-map.2013.0714
pub_keyword,iet_inspecKeyword,pub_concept
6
6
Loading