http://iet.metastore.ingenta.com
1887

Fast and automatic security test on cryptographic ICs against fault injection attacks based on design for security test

Fast and automatic security test on cryptographic ICs against fault injection attacks based on design for security test

For access to this article, please select a purchase option:

Buy eFirst article PDF
£12.50
(plus tax if applicable)
Buy Knowledge Pack
10 articles for £75.00
(plus taxes if applicable)

IET members benefit from discounts to all IET publications and free access to E&T Magazine. If you are an IET member, log in to your account and the discounts will automatically be applied.

Learn more about IET membership 

Recommend to library

You must fill out fields marked with: *

Librarian details
Name:*
Email:*
Your details
Name:*
Email:*
Department:*
Why are you recommending this title?
Select reason:
 
 
 
 
 
— Recommend this title to your library

Thank you

Your recommendation has been sent to your librarian.

Fault injection attacks have constituted a serious threat against cryptographic integrated circuits (ICs). However, the security test nowadays is just sample test with workload statistics and experiences as the qualitative criterion, and results in costly, time-consuming and error-prone test procedures. This study presents a design for security test (DFST) method for cryptographic ICs against fault injection attacks. The DFST involves identifying the sensitive registers for various crypto modules, inserting the scan chains and generating the specific test patterns for security test. Then the security test is conducted on the manufactured cryptographic ICs with the industrial automatic test equipment. With this DFST method, a fast and automatic security test can be applied onto volume production of cryptographic ICs. Experimental results on an RSA implementation demonstrate the validity of this method.

http://iet.metastore.ingenta.com/content/journals/10.1049/iet-ifs.2016.0203
Loading

Related content

content/journals/10.1049/iet-ifs.2016.0203
pub_keyword,iet_inspecKeyword,pub_concept
6
6
Loading
This is a required field
Please enter a valid email address