RT Journal Article
A1 Anju Meghwani
A1 Suresh C. Srivastava
A1 Saikat Chakrabarti

PB iet
T1 Local measurement-based technique for estimating fault location in multi-source DC microgrids
JN IET Generation, Transmission & Distribution
VO 12
IS 13
SP 3305
OP 3313
AB Quick fault detection and isolation of faulty section are desired in DC microgrid due to the presence of power electronic converters and low cable impedances. Owing to need of fast disconnection, limited time and data are available for online fault distance estimation. Some of the existing techniques consider source capacitors connected at only one end of the cable; therefore, assume that the fault current is contributed by only one end of the cable. This may not be true in the case of multi-source DC microgrids, where fault current would be supplied from both the ends. Further, existing communication-based techniques require either data synchronisation or fast communication network. To address these issues, this study proposes an online fault location method for multi-source DC microgrid without using communication. The mathematical model of faulted cable section connected to sources at both the ends is derived. This model is used along with the measurements to determine the fault distance. The model consistency with the measurements is quantified using the confidence level based on the residual analysis. A ring-type multi-source DC microgrid system is considered and simulated on real-time digital simulator to demonstrate the effectiveness of the proposed algorithm.
K1 fast communication network
K1 residual analysis
K1 communication-based techniques
K1 low cable impedances
K1 real-time digital simulator
K1 online fault location method
K1 online fault distance estimation
K1 power electronic converters
K1 data synchronisation
K1 fault detection and isolation
K1 fault current
K1 fault location estimation
K1 mathematical model
K1 ring-type multisource DC microgrid system
K1 faulted cable section
K1 local measurement-based technique
K1 model consistency
K1 confidence level
K1 source capacitors
DO https://doi.org/10.1049/iet-gtd.2017.1801
UL https://digital-library.theiet.org/;jsessionid=181mbdf1rq9fq.x-iet-live-01content/journals/10.1049/iet-gtd.2017.1801
LA English
SN 1751-8687
YR 2018
OL EN