http://iet.metastore.ingenta.com
1887

Automatic adaptation of SIFT for robust facial recognition in uncontrolled lighting conditions

Automatic adaptation of SIFT for robust facial recognition in uncontrolled lighting conditions

For access to this article, please select a purchase option:

Buy eFirst article PDF
£12.50
(plus tax if applicable)
Buy Knowledge Pack
10 articles for £75.00
(plus taxes if applicable)

IET members benefit from discounts to all IET publications and free access to E&T Magazine. If you are an IET member, log in to your account and the discounts will automatically be applied.

Learn more about IET membership 

Recommend to library

You must fill out fields marked with: *

Librarian details
Name:*
Email:*
Your details
Name:*
Email:*
Department:*
Why are you recommending this title?
Select reason:
 
 
 
 
 
— Recommend this title to your library

Thank you

Your recommendation has been sent to your librarian.

The scale invariant feature transform (SIFT), which was proposed by David Lowe, is a powerful method that extracts and describes local features called keypoints from images. These keypoints are invariant to scale, translation, and rotation, and partially invariant to image illumination variation. Despite their robustness against these variations, strong lighting variation is a difficult challenge for SIFT-based facial recognition systems, where significant degradation of performance has been reported. To develop a robust system under these conditions, variation in lighting must be first eliminated. Additionally, SIFT parameter default values that remove unstable keypoints and inadequately matched keypoints are not well-suited to images with illumination variation. SIFT keypoints can also be incorrectly matched when using the original SIFT matching method. To overcome this issue, the authors propose propose a method for removing the illumination variation in images and correctly setting SIFT's main parameter values (contrast threshold, curvature threshold, and match threshold) to enhance SIFT feature extraction and matching. The proposed method is based on an estimation of comparative image lighting quality, which is evaluated through an automatic estimation of gamma correction value. Through facial recognition experiments, the authors find significant results that clearly illustrate the importance of the proposed robust recognition system.

http://iet.metastore.ingenta.com/content/journals/10.1049/iet-cvi.2017.0190
Loading

Related content

content/journals/10.1049/iet-cvi.2017.0190
pub_keyword,iet_inspecKeyword,pub_concept
6
6
Loading
This is a required field
Please enter a valid email address