Test data compression for system-on-a-chip using extended frequency-directed run-length code
Test data compression for system-on-a-chip using extended frequency-directed run-length code
- Author(s): A.H. El-Maleh
- DOI: 10.1049/iet-cdt:20070028
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- Author(s): A.H. El-Maleh 1
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View affiliations
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Affiliations:
1: Department of Computer Engineering, King Fahd University of Petroleum and Minerals, Dhahran, Saudi Arabia
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Affiliations:
1: Department of Computer Engineering, King Fahd University of Petroleum and Minerals, Dhahran, Saudi Arabia
- Source:
Volume 2, Issue 3,
May 2008,
p.
155 – 163
DOI: 10.1049/iet-cdt:20070028 , Print ISSN 1751-8601, Online ISSN 1751-861X
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One of the major challenges in testing a system-on-a-chip is dealing with the large volume of test data. To reduce the volume of test data, several test data compression techniques have been proposed. Frequency-directed run-length (FDR) code is a variable-to-variable run length code based on encoding runs of 0s. It is demonstrated that higher test data compression can be achieved based on encoding both runs of 0s and 1s. An extension to the FDR code is proposed and by experimental results its effectiveness in achieving a higher compression ratio is demonstrated.
Inspec keywords: system-on-chip; data compression; variable length codes; logic testing; runlength codes
Other keywords:
Subjects: Codes; Digital circuit design, modelling and testing; Microprocessor chips; Logic design methods; Microprocessors and microcomputers
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