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On-chip generation of primary input sequences for multicycle functional broadside tests

On-chip generation of primary input sequences for multicycle functional broadside tests

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Functional broadside tests are important for avoiding overtesting of delay faults during the application of scan-based tests. Multicycle tests have advantages in defect detection and test compaction. This study addresses the on-chip generation of primary input sequences for the application of multicycle functional broadside tests to a circuit that is embedded in a larger design. In this study, multicycle functional broadside tests are considered under two types of constraints: (i) functional constraints that the design imposes on the primary input patterns of the circuit, and (ii) test application constraints when direct access to the primary inputs of the circuit is not available, and the application of two or more consecutive primary input patterns requires hardware support. The use of multicycle functional broadside tests also results in an increased fault coverage.

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