Probabilistic model for nanocell reliability evaluation in presence of transient errors

Renu Kumawat; Vineet Sahula; Manoj Singh Gaur

Probabilistic model for nanocell reliability evaluation in presence of transient errors

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Author(s): Renu Kumawat ¹ ; Vineet Sahula ² ; Manoj Singh Gaur ³
- Affiliations: 1: Department of Electronics and Communication Engineering, School of Electrical, Electronics and Communication, Manipal University, Jaipur, Rajasthan, India;
  2: Department of Electronics and Communication Engineering, Malaviya National Institute of Technology, Jaipur, Rajasthan, India;
  3: Department of Computer Engineering, Malaviya National Institute of Technology, Jaipur, Rajasthan, India
Source: Volume 9, Issue 4, July 2015, p. 213 – 220
DOI: 10.1049/iet-cdt.2014.0124 , Print ISSN 1751-8601, Online ISSN 1751-861X

Received 11/06/2014, Accepted 05/01/2015, Revised 18/11/2014, Published 27/04/2015

In this study, the authors propose a novel extended continuous time birth–death model for reliability analysis of a nanocell device. A nanocell consists of conducting nanoparticles connected via randomly placed self-assembled monolayer of molecules. These molecules behave as a negative differential resistor. The mathematical expression for expected nanocell lifetime and its availability, in presence of transient errors is computed. On the basis of the model, an algorithm is developed and implemented in MATLAB, PERL and HSPICE, to automatically generate the proposed model representation for a given nanocell. It is used to estimate the success_ratio as well as the nanocell reliability, while considering the uncertainties induced by transient errors. The theoretical results for reliability are validated by simulating HSPICE model of nanocell in presence of varying defect rates. It is observed that the device reliability increases with increase in the number of nanoparticles and molecules. A lower and upper bounds for nanocell reliability are calculated in theory which is validated in simulations.

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Probabilistic model for nanocell reliability evaluation in presence of transient errors

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