Fazeli, M.; Miremadi, S.G.; Ejlali, A.; Patooghy, A.: 'Low energy single event upset/single event transient-tolerant latch for deep subMicron technologies', IET Computers & Digital Techniques, 2009, 3, (3), p. 289-303, DOI: 10.1049/iet-cdt.2008.0099
IET Digital Library, https://digital-library.theiet.org/;jsessionid=1svrml0h2krwd.x-iet-live-01content/journals/10.1049/iet-cdt.2008.0099