K. Ramaniharan, Pasupathy; Boby, Bindu: 'Widening and narrowing of time interval due to single-event transients in 45 nm vernier-type TDC', IET Circuits, Devices & Systems, 2017, 11, (6), p. 676-681, DOI: 10.1049/iet-cds.2016.0512
IET Digital Library, https://digital-library.theiet.org/;jsessionid=1cfjda158ghrt.x-iet-live-01content/journals/10.1049/iet-cds.2016.0512