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access icon free Test and study on sensitivity of electronic circuit in low-voltage release to voltage sags

© The Institution of Engineering and Technology
Received 16/06/2016, Accepted 02/12/2016, Revised 28/10/2016, Published 09/12/2016

This study focuses on sensitivity of electronic circuit in low-voltage release to voltage sags based on a large-scale test results. Although studies about ride-through capability of some electronic devices during voltage sags have been carried out, there is few research available on sensitivity of electronic circuit in low-voltage release to voltage sags. Operation principle and working states of electromagnetic structure are discussed. Subsequently, a detailed test scheme is proposed based on latest standards and several kinds of 220 V low-voltage releases have been tested. Test results indicate that output waveform of electronic circuit under voltage sags can be classified into two types, which shows a clear correspondence with working state of electromagnetic structure and tripping condition of low-voltage release. Finally, six working modes are presented to analyse the relationship between output waveform of electronic circuit and the magnitude and duration of voltage sags in details.

Inspec keywords: circuit breakers; power supply quality; waveform analysis; sensitivity analysis

Other keywords: large-scale test results; operation principle; voltage sags; tripping condition; electronic circuit waveform; electronic devices; low-voltage release; voltage 220 V; electromagnetic structure; electronic circuit sensitivity; ride-through capability

Subjects: Power supply quality and harmonics; General circuit analysis and synthesis methods; Mathematical analysis; Switchgear

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