Ouyang, Sen; Liu, Liyuan: 'Test and study on sensitivity of electronic circuit in low-voltage release to voltage sags', IET Circuits, Devices & Systems, 2017, 11, (6), p. 529-534, DOI: 10.1049/iet-cds.2016.0222
IET Digital Library, https://digital-library.theiet.org/;jsessionid=33knt23jihl1i.x-iet-live-01content/journals/10.1049/iet-cds.2016.0222