Built-in self-test structure for fault detection of charge-pump phase-locked loop

Lanhua Xia; Jianhui Wu; Cheng Huang; Meng Zhang

Built-in self-test structure for fault detection of charge-pump phase-locked loop

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Author(s): Lanhua Xia ^{1, 2} ; Jianhui Wu ^{1, 2} ; Cheng Huang ¹ ; Meng Zhang ¹
- Affiliations: 1: National ASIC System Engineering Research Center, Southeast University, Nanjing, Jiangsu Province 210096, People's Republic of China ;
  2: Jiangsu Provincial Key Laboratory of Sensor Network Technology, Southeast University, Nanjing 210096, People's Republic of China
Source: Volume 10, Issue 4, July 2016, p. 317 – 321
DOI: 10.1049/iet-cds.2015.0224 , Print ISSN 1751-858X, Online ISSN 1751-8598

Received 17/04/2015, Accepted 23/11/2015, Revised 20/11/2015, Published 01/07/2016

A defect-oriented built-in self-test (BIST) structure of charge-pump phase-locked loop (CP-PLL) for high fault coverage and low area overhead test solution is proposed. It employs a new structure of phase/frequency detector, a D flip-flop and some existing blocks in the PLL as the input stimulus generator and fault feature extracted devices for testing evaluation. Thus, no extra test stimulus or high-performance measured instruments are required for test. The structure is easily implemented and has a little influence on the performance of CP-PLL. Fault simulation results indicate that the proposed BIST structure has high fault coverage (98.75%) and low area overhead (0.78%).

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Built-in self-test structure for fault detection of charge-pump phase-locked loop

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