access icon free Stability analysis of broadband cascode amplifiers in the presence of inductive parasitic components

Theoretical stability analysis of broadband cascode amplifiers at high frequencies is presented. The stability of the amplifier in the presence of parasitic inductive components is thoroughly investigated. It is shown that the stability can be improved by inserting a series resistance in the gate of common-gate device of the cascode amplifier. To ensure stability, the gate resistance should be selected within specific ranges that are derived analytically. Based on the insights provided by the analyses, several practical design guidelines are given to improve the stability of high-frequency broadband cascode amplifiers. Finally, the derived results are adopted in stabilisation of an X-band cascode amplifier implemented in a 0.18 μm complementary metal oxide semiconductor process.

Inspec keywords: CMOS analogue integrated circuits; integrated circuit design; wideband amplifiers; circuit stability

Other keywords: inductive parasitic component; X-band cascode amplifier; high-frequency broadband cascode amplifier; complementary metal oxide semiconductor process; size 0.18 mum; common-gate device; theoretical stability analysis; series resistance

Subjects: CMOS integrated circuits; Amplifiers; Semiconductor integrated circuit design, layout, modelling and testing

References

    1. 1)
    2. 2)
      • 1. Carson, R.: ‘High-frequency amplifiers’ (John Wiley & Sons, New York, 1975).
    3. 3)
      • 18. Su, Y., O, K.K.: ‘An 800 μW 26 GHz CMOS tuned amplifier’. Proc. IEEE RFIC Symp., 2006, pp. 151154.
    4. 4)
    5. 5)
    6. 6)
    7. 7)
    8. 8)
    9. 9)
      • 3. Razavi, B.: ‘RF microelectronics’ (Prentice-Hall, 2011, 2nd edn.).
    10. 10)
      • 2. Pozar, D.M.: ‘Microwave engineering’ (Wiley, New York, 2005, 3rd edn.).
    11. 11)
    12. 12)
    13. 13)
    14. 14)
    15. 15)
    16. 16)
    17. 17)
    18. 18)
    19. 19)
    20. 20)
http://iet.metastore.ingenta.com/content/journals/10.1049/iet-cds.2013.0470
Loading

Related content

content/journals/10.1049/iet-cds.2013.0470
pub_keyword,iet_inspecKeyword,pub_concept
6
6
Loading