Masked SIFT with align-based refinement for contactless palmprint recognition
- Author(s): Ahmed S. ELSayed 1 ; Hala M. Ebeid 2 ; Mohamed I. Roushdy 1 ; Zaki T. Fayed 1
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View affiliations
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Affiliations:
1:
Computer Science Department, Ain Shams University , Abbassia, Cairo , Egypt ;
2: Scientific Computing Department, Ain Shams University , Abbassia, Cairo , Egypt
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Affiliations:
1:
Computer Science Department, Ain Shams University , Abbassia, Cairo , Egypt ;
- Source:
Volume 8, Issue 2,
March
2019,
p.
150 – 158
DOI: 10.1049/iet-bmt.2018.5012 , Print ISSN 2047-4938, Online ISSN 2047-4946
Contactless palmprint is considered more user convenient than other biometrics due to its acquisition simplicity and less-private nature. Many challenges arise which affect the performance of common contact-based methods when applied to a contactless environment. For example, pose and illumination variations affect the layout and visibility of palm lines. This study proposes a SIFT-based method with three main modifications from the traditional SIFT. First, the palm regions with no significant lines/wrinkles are masked out to reduce the false features. A region with multi-lines is then described by multi-descriptors rather than a single one. Second, only query and target keypoints with small rotation difference are compared together, instead of comparing them all. This speed-up the comparison and enhance the accuracy, versus SIFT, by reducing the wrong matches. Third, an align-based refinement is applied to filter out the incorrect matches. The method is tested on three contactless hand databases; IITD, GPDS and Sfax-Miracl. It achieves a verification equal error rate of 0.72, 0.84 and 1.14% and a correct identification rate of 98.9, 99 and 98.9% on each database, respectively. These results are significantly better than the state-of-art methods on the same databases by 1.9% for verification and 3.2% for identification.
Inspec keywords: image matching; palmprint recognition; transforms; feature extraction; biometrics (access control)
Other keywords: visibility; query keypoints; traditional SIFT; contactless environment; illumination variations; verification equal error rate; palm lines; palm regions; layout; common contact-based methods; rotation difference; biometrics; less-private nature; comparison process; false features; multidescriptors; align-based refinement; significant lines/wrinkles; masked SIFT; multilines; contactless palmprint recognition; contactless hand databases; main modifications; user convenient; acquisition simplicity
Subjects: Integral transforms; Data security; Computer vision and image processing techniques; Image recognition; Integral transforms
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