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Single-sampling-point coherent detection in continuous-wave photomixing terahertz systems

Single-sampling-point coherent detection in continuous-wave photomixing terahertz systems

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Electro-optical control of the terahertz phase in continuous-wave photomixing terahertz systems allows the determination of both terahertz amplitude and phase with a single sampling point per frequency. It is experimentally demonstrated that spectroscopic measurements can be performed by an order of magnitude faster with the single sampling point method without performance degradation compared to the standard delay line technique.

References

    1. 1)
      • T. Gäbel , D. Schoenherr , C. Sydlo , M. Feiginov , P. Meissner , H.L. Hartnagel . Continuous-wave terahertz system with electro-optical terahertz phase control. Electron. Lett. , 14 , 863 - 864
    2. 2)
      • Gäbel, T., Schoenherr, D., Sydlo, C., Feiginov, M., Meissner, P., Hartnagel, H.L.: `Direct phase detection in continuous-wave photomixing THz systems', Proc. 21st Annual Meet. of the IEEE Lasers and Electro-Optics Society, November 2008, Newport Beach, CA, USA.
    3. 3)
    4. 4)
    5. 5)
      • I.S. Gregory . Phase sensitive continuous-wave THz imaging using diode lasers. Electron. Lett. , 2 , 143 - 145
    6. 6)
    7. 7)
      • J. Hinojosa . S-parameter broad-band measurements on-microstrip and fast extraction of the intrinsic substrate properties. IEEE Microw. Wirel. Compon. Lett. , 7 , 305 - 307
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