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Drift reduction in ion-sensitive FETs using correlated double sampling

Drift reduction in ion-sensitive FETs using correlated double sampling

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© The Institution of Engineering and Technology
Published

A discrete-time technique, correlated double sampling (CDS), as a method to reduce drift during ion-sensitive field effect transistor (ISFET) operation is presented. The CDS technique exploits switched capacitors to resolve low-frequency signal errors such as drift and 1/f noise, which are generated by an ISFET and its readout. In conjunction with post-processing, experimental results confirm drift reduction using this technique.

Inspec keywords: ion sensitive field effect transistors; sampling methods; discrete transforms; switched capacitor networks

Other keywords: ion sensitive FETs; field effect transistor; switched capacitors; discrete-time technique; correlated double sampling; low-frequency signal errors

Subjects: Other topics in statistics; Insulated gate field effect transistors; Integral transforms

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