Practical technique for measurement of second-order nonlinearity in poled glass
Practical technique for measurement of second-order nonlinearity in poled glass
- Author(s): C. Corbari ; O. Deparis ; B.G. Klappauf ; P.G. Kazansky
- DOI: 10.1049/el:20030137
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- Author(s): C. Corbari 1 ; O. Deparis 1 ; B.G. Klappauf 1 ; P.G. Kazansky 1
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View affiliations
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Affiliations:
1: Optoelectronics Research Centre, University of Southampton, Southampton, United Kingdom
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Affiliations:
1: Optoelectronics Research Centre, University of Southampton, Southampton, United Kingdom
- Source:
Volume 39, Issue 2,
23 January 2003,
p.
197 – 198
DOI: 10.1049/el:20030137 , Print ISSN 0013-5194, Online ISSN 1350-911X
A simple and nondestructive technique for measuring the thickness of the nonlinear optical layer in thermally poled glass, providing a minimum measurable thickness of 4 and 1 µm resolution, is demonstrated. This technique is generally applicable to other nonlinear optical layers as well.
Inspec keywords: optical glass; nonlinear optical susceptibility; optical harmonic generation; dielectric polarisation; thickness measurement; silicon compounds
Other keywords:
Subjects: Optical glass; Optical harmonic generation, frequency conversion, parametric oscillation and amplification; Spatial variables measurement; Spatial variables measurement; Optical harmonic generation, frequency conversion, parametric oscillation and amplification; Optical materials
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