2 W reliable operation in 50 µm-wide InGaAsP/InGaP/AlGaAs (λ = 810 nm) SQW diode lasers with tensile-strained InGaP barriers

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2 W reliable operation in 50 µm-wide InGaAsP/InGaP/AlGaAs (λ = 810 nm) SQW diode lasers with tensile-strained InGaP barriers

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A new InGaAsP/InGaP/AlGaAs (λ = 810 nm) laser with tensile-strained InGaP barriers, broad waveguide structure and current blocking region near the facet is reported. 2 W continuous wave operation over 2000 h from a 50 µm aperture was achieved.

Inspec keywords: laser reliability; gallium compounds; MOCVD; optical fabrication; indium compounds; gallium arsenide; III-V semiconductors; waveguide lasers; aluminium compounds; laser beams; quantum well lasers

Other keywords: broad waveguide structure; continuous wave operation; single quantum well laser; InGaP; InGaAsP/InGaP/AlGaAs laser; aperture; facet; tensile-strained barriers; 2000 h; InGaP barriers; current blocking region; InGaAsP-InGaP-AlGaAs; 50 mum; InGaAsP/InGaP/AlGaAs SQW diode lasers; 2 W; tensile-strained InGaP barriers; 810 nm; reliable operation

Subjects: Laser beam characteristics and interactions; Optoelectronics manufacturing; Design of specific laser systems; Semiconductor lasers; Maintenance and reliability; Optical waveguides; Surface treatment and coating techniques; Laser beam interactions and properties; Optical waveguides and couplers; Engineering materials; Chemical vapour deposition; Lasing action in semiconductors; Optical fabrication, surface grinding; Reliability; Chemical vapour deposition

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      • J.K. Wade , L.J. Mawst , D. Botez , M. Jansen , F. Fang , R.F. Nabiev . High-continuous wave power 0.8 µm band, Al-free active-region diodelasers. Appl. Phys. Lett. , 149 - 151
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      • T. Fukunaga , M. Wada , T. Hayakawa . High-power 0.8 µm InGaAsP/InGaP/AlGaAs single quantum well laserswith tensile-strained InGaP barriers. Jpn. J. Phys. , L387 - L389
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      • T. Fukunaga , M. Wada , H. Asano , T. Hayakawa . Highly reliable operation of high-power InGaAsP/InGaP/AlGaAs 0.8 µmseparate confinement heterostructure lasers. Jpn. J. Appl. Phys. , L1175 - L1177
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      • T. Hayakawa , M. Wada , F. Yamanaka , H. Asano , T. Kuniyasu , T. Ohgoh , T. Fukunaga . Effects of broad-waveguide structure in 0.8 µm high-power InGaAsP/InGaP/AlGaAslasers. Appl. Phys. Lett. , 1839 - 1841
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