Rayleigh backscattering measurement of 10 m long silica-based waveguides

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Rayleigh backscattering measurement of 10 m long silica-based waveguides

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The authors report the Rayleigh backscattering distributions of 10 m long silica-based waveguides fabricated on one substrate. These were obtained using a range-extended optical low coherence reflectometer. The results reveal that the best sample waveguide has a uniform loss of 1.7 dB/m throughout its length, and that although the others have loss increases due to defects, the main regions which are free of the defects have the same uniform loss. This uniformity indicates that the 1.7 dB/m loss is not caused by the ~200 bends in each waveguide.

Inspec keywords: optical planar waveguides; optical losses; Rayleigh scattering; optical time-domain reflectometry; light coherence; silicon compounds

Other keywords: loss increases; planar lightwave circuits; 10 m; uniform loss; range-extended optical low coherence reflectometer; Rayleigh backscattering measurement; SiO2; bends

Subjects: Optical variables measurement; Integrated optics; Integrated optics; Optical waveguides; Optical refractometry and reflectometry; Optical waveguides and couplers; Optical coherence in homogeneous media

References

    1. 1)
      • K. Takada , Y. Yamada , Y. Hibino , S. Mitachi . Range extension in optical low coherence reflectometry achieved by usinga pair of retroreflectors. Electron. Lett. , 1565 - 1566
    2. 2)
      • Hida, Y., Hibino, Y., Okazaki, H., Ohmori, Y.: `10 m long silica-based waveguide with a loss of 1.7 dB/m', IThC6-1, Proc. Integrated Photonics Research Conf., 1995, p. 49–51.
    3. 3)
      • M. Okuno , K. Kato , Y. Ohmori , T. Matsunaga . Improved 8×8 integrated optic matrix switch using silica-basedplanar lightwave circuits. J. Lightwave Technol. , 9 , 1597 - 1606
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