Your browser does not support JavaScript!
http://iet.metastore.ingenta.com
1887

Switching circuits for yield-enhancement of an array chip

Switching circuits for yield-enhancement of an array chip

For access to this article, please select a purchase option:

Buy article PDF
£12.50
(plus tax if applicable)
Buy Knowledge Pack
10 articles for £75.00
(plus taxes if applicable)

IET members benefit from discounts to all IET publications and free access to E&T Magazine. If you are an IET member, log in to your account and the discounts will automatically be applied.

Learn more about IET membership 

Recommend Title Publication to library

You must fill out fields marked with: *

Librarian details
Name:*
Email:*
Your details
Name:*
Email:*
Department:*
Why are you recommending this title?
Select reason:
 
 
 
 
 
Electronics Letters — Recommend this title to your library

Thank you

Your recommendation has been sent to your librarian.

McCanny and McWhirter describe a method for enhancing the yield of a bit-level systolic array chip. A limitation of their approach is that all the configuration circuitry must work. We have examined alternative approaches which tolerate some defects in this circuitry and find one scheme in particular which turns out to be much more effective.

References

    1. 1)
      • Wood, D., Evans, R.A., Wood, K.: `An 8-bit serial convolver chip based on a bit level systolic array', IEEE Custom Integrated Circuits Conference, May 1983, p. 256–261.
    2. 2)
      • W.R. Moore . Fault detection and correction in array computers for image processing. IEE Proc. E, Comput. & Digital Tech. , 229 - 234
    3. 3)
      • Kung, H.T., Lam, M.S.: `Fault-tolerance and two-level pipelining in VLSI systolic arrays', MIT Conference on advanced research in VLSI, January 1984.
    4. 4)
      • W.R. Moore , M.J. Day . Yield-enhancement of a large systolic array chip. Microelectron. & Reliab.
    5. 5)
      • J.V. McCanny , J.G. McWhirter . Yield enhancement of bit level systolic array chips using fault-tolerance techniques. Electron. Lett. , 525 - 527
    6. 6)
      • W.R. Moore . A review of fault-tolerant techniques for the enhancement of integrated circuit yield. GEC J. Res. , 1 - 15
http://iet.metastore.ingenta.com/content/journals/10.1049/el_19840457
Loading

Related content

content/journals/10.1049/el_19840457
pub_keyword,iet_inspecKeyword,pub_concept
6
6
Loading
Errata
An Erratum has been published for this content:
Erratum: Switching circuits for yield-enhancement of an array chip
This is a required field
Please enter a valid email address