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Electro-optic sampling with picosecond resolution

Electro-optic sampling with picosecond resolution

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© The Institution of Electrical Engineers
Published

The development of an electro-optic sampling system with resolution of better than 2 picoseconds and shot noise limited sensitivity of 11 μV/√Hz is reported. This system has been used to characterise GaAs photodiodes which have exhibited pulsewidths as short as 5.4 picoseconds (full-width-half-maximum).

Inspec keywords: characteristics measurement; III-V semiconductors; gallium arsenide; photodiodes; electro-optical devices

Other keywords: GaAs photodiodes; resolution; shot noise limited sensitivity; electro-optic sampling system; pulsewidths

Subjects: Photoelectric devices; Electro-optical devices; II-VI and III-V semiconductors

References

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      • I.P. Kaminow , E.H. Turner . Electro-optic light modulators. Proc. IEEE , 1374 - 1390
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      • R.N. Bracewell . (1978) , The Fourier transform and its application.
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      • WANG, S. Y., and BLOOM, D. M.: ‘100 GHz bandwidth planar GaAs Schottky photodiode’ (unpublished).
    4. 4)
      • P. le Fur , D.N. Auston . A kilovolt picosecond optoelectronic switch and Pockel' cell. Appl. Phys. Lett. , 21 - 23
    5. 5)
      • J.A. Valdmanis , G. Mourou , C.W. Gabel . Picosecond electro-optic sampling system. Appl. Phys. Lett. , 211 - 212
    6. 6)
      • K.C. Gupta . (1979) , Microstrip lines and slot lines.
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