RT Journal Article

PB iet
T1 interview
JN Electronics Letters
VO 54
IS 12
SP 730
OP 730
AB
DO https://doi.org/10.1049/el.2018.1385
UL https://digital-library.theiet.org/;jsessionid=gge0l5gpf2c70.x-iet-live-01content/journals/10.1049/el.2018.1385
LA English
SN 0013-5194
YR 2018
OL EN