Deppe, D.G.; Leshin, J.; Leshin, J.; Eifert, L.; Tucker, F.; Hillyer, T.: 'Transverse mode confinement in lithographic VCSELs', Electronics Letters, 2017, 53, (24), p. 1598-1600, DOI: 10.1049/el.2017.2780
IET Digital Library, https://digital-library.theiet.org/;jsessionid=2dp15tbmndk3b.x-iet-live-01content/journals/10.1049/el.2017.2780