Yu, J.; Woo, W.: 'Divide-conquer method for improving possibilistic c-means', Electronics Letters, 2017, 53, (3), p. 154-156, DOI: 10.1049/el.2016.2951 IET Digital Library, https://digital-library.theiet.org/;jsessionid=1isxlci2k11vm.x-iet-live-01content/journals/10.1049/el.2016.2951