RT Journal Article

PB iet
T1 interview
JN Electronics Letters
VO 52
IS 14
SP 1188
OP 1188
AB
DO https://doi.org/10.1049/el.2016.2125
UL https://digital-library.theiet.org/;jsessionid=kcxwxfrp24hw.x-iet-live-01content/journals/10.1049/el.2016.2125
LA English
SN 0013-5194
YR 2016
OL EN