: 'interview', Electronics Letters, 2016, 52, (14), p. 1188-1188, DOI: 10.1049/el.2016.2125 IET Digital Library, https://digital-library.theiet.org/;jsessionid=6p2f5ljb36pff.x-iet-live-01content/journals/10.1049/el.2016.2125