RT Journal Article
PB iet
T1 interview
JN Electronics Letters
VO 51
IS 17
SP 1298
OP 1298
AB
DO https://doi.org/10.1049/el.2015.2700
UL https://digital-library.theiet.org/;jsessionid=f64vgfrg00ur.x-iet-live-01content/journals/10.1049/el.2015.2700
LA English
SN 0013-5194
YR 2015
OL EN