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Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits: the system on chip approach

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Editor: Yichuang Sun 1
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Publication Year: 2008

This book provides a comprehensive discussion of automatic testing, diagnosis and tuning of analogue, mixed-signal and RF integrated circuits, and systems in a single source. As well as fundamental concepts and techniques, the book reports systematically the state of the arts and future research directions of those areas. A complete range of circuit components are covered and test issues from the SoC perspective. An essential reference for researchers and engineers in mixed signal testing, postgraduate and senior undergraduate students.

Inspec keywords: system-on-chip; analogue integrated circuits; integrated circuit testing; automatic testing; mixed analogue-digital integrated circuits

Other keywords: integrated circuit testing; RF integrated circuits; fault diagnosis; mixed-signal integrated circuits; automatic SoC testing; single-chip transceiver; systems-on-chip; analogue integrated circuits

Subjects: Digital circuit design, modelling and testing; Analogue circuit design, modelling and testing; System-on-chip; Semiconductor integrated circuit design, layout, modelling and testing; System-on-chip; Mixed analogue-digital circuits; Automatic test systems

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