RT Book SR Electronic(1) A1 Stanley L. Hurst YR 1998 T1 VLSI Testing: digital and mixed analogue/digital techniques PB Institution of Engineering and Technology JF Materials, Circuits and Devices K1 VLSI testing K1 mixed analogue/digital IC K1 mixed analogue/digital techniques K1 digital network testing K1 integrated circuit testing K1 signal processing K1 IC chip K1 IC testing SN 9780852969014 UL https://digital-library.theiet.org/;jsessionid=24qqwwon48fmt.x-iet-live-01content/books/cs/pbcs009e