In this chapter, we introduced the noise modeling and parameter extraction methods for FET device, as well as how to determine noise parameters, including the tuner-based method and the noise figure-based method.

Chapter Contents:

• 6.1 Overview of Noise Model
• 6.2 Scalable Noise Model
• 6.3 Noise Parameters Extraction Method
• 6.4 Relationships among CS, CG, and CD FETs
• 6.5 Summary

Inspec keywords: semiconductor device noise; field effect transistors; circuit tuning; semiconductor device models

Other keywords: noise figure-based method; field effect transistor; FET device; tuner-based method; noise parameter; parameter extraction technique; microwave noise modeling

Subjects: Semiconductor device modelling, equivalent circuits, design and testing; Insulated gate field effect transistors