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GaAs MESFET comparators for high speed Analog-to-Digital conversion

GaAs MESFET comparators for high speed Analog-to-Digital conversion

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A novel GaAs MESFET comparator for high speed and medium resolution ADC is described. These comparators do not require any reference voltages. Threshold levels are built into comparators themselves. The com parators and coding logic for flash converter type 2and 3-bit ADC were designed and fabricated in monolithic form. The ICs were operated at an effective sampling rate of 1.0 GHz. A two-stage comparator design will improve the sensitivity and provide 4-bit ADC resolution. Sample-and-hold circuits are being developed at various laboratories. Master-slave flip-flops can be used for latches. Therefore, a single-chip monolithic 3or 4-bit GaAs FET ADC for gigahertz sampling rate operation can be fabricated in the near future. Further work is required to study the errors and temperature effects before incorporating these ADCs into real systems.

Inspec keywords: gallium arsenide; flip-flops; sample and hold circuits; digital-analogue conversion; Schottky gate field effect transistors; comparators (circuits)

Other keywords: word length 2 bit; MESFET comparators; coding logic; latches; single-chip monolithic FET; medium resolution ADC; gigahertz sampling rate operation; master-slave flip-flops; GaAs; flash converter ADC; word length 4 bit; word length 3 bit; two-stage comparator design; sample-and-hold circuits; frequency 1 GHz; high speed analog-to-digital conversion

Subjects: A/D and D/A convertors

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