Your browser does not support JavaScript!
http://iet.metastore.ingenta.com
1887

Using Patterns for model assessment

Using Patterns for model assessment

For access to this article, please select a purchase option:

Buy chapter PDF
£10.00
(plus tax if applicable)
Buy Knowledge Pack
10 chapters for £75.00
(plus taxes if applicable)

IET members benefit from discounts to all IET publications and free access to E&T Magazine. If you are an IET member, log in to your account and the discounts will automatically be applied.

Learn more about IET membership 

Recommend Title Publication to library

You must fill out fields marked with: *

Librarian details
Name:*
Email:*
Your details
Name:*
Email:*
Department:*
Why are you recommending this title?
Select reason:
 
 
 
 
 
Foundations for Model-based Systems Engineering: From Patterns to Models — Recommend this title to your library

Thank you

Your recommendation has been sent to your librarian.

Patterns can be used in many ways, one of these is as an assessment tool considering the extent of existing Frameworks. This chapter will discuss the practice of model assessment by applying a simple set of metrics to different aspects of a Framework. This chapter will provide two example assessments before describing the application of the Epoch Pattern which has been used to carry them out. The examples are not defined using the FAF as this is likely to make the assessment too easy to deliver and will not show the benefit of applying assessments to any model. The examples will take an existing ontology from a partially defined Framework and a set of Viewpoints from another partial Framework. In each assessment a number of Patterns from Part 2 will be selected and compared with the example model, the results of this comparative assessment and discussion of the meaning and effect will follow.

Chapter Contents:

  • 20.1 Introduction
  • 20.2 Assessing Framework ontologies
  • 20.2.1 Ontology assessment summary
  • 20.3 Assessing Framework Viewpoints
  • 20.3.1 Viewpoint assessment summary
  • 20.4 The Epoch Pattern for model assessment
  • Further reading

Inspec keywords: ontologies (artificial intelligence)

Other keywords: ontology; FAF; model assessment; epoch pattern

Subjects: Knowledge engineering techniques

Preview this chapter:
Zoom in
Zoomout

Using Patterns for model assessment, Page 1 of 2

| /docserver/preview/fulltext/books/pc/pbpc014e/PBPC014E_ch20-1.gif /docserver/preview/fulltext/books/pc/pbpc014e/PBPC014E_ch20-2.gif

Related content

content/books/10.1049/pbpc014e_ch20
pub_keyword,iet_inspecKeyword,pub_concept
6
6
Loading
This is a required field
Please enter a valid email address