In this chapter, we have tried to provide insights into ΣΔ modulator tests. It has been shown that the ever-increasing levels of functionality integration, the ultimate expression of which is SoC, raise new problems on how to test embedded components such as Σ Δ modulators. These issues may even compromise the test feasibility, or at least they may displace test time from its prominent position in the list of factors that determine the overall test cost. Table 8.1 summarizes the information contained in the chapter. It is clear that considerable research is still necessary to produce a satisfying solution, but the first steps are encouraging. In particular, we believe that solutions based on behavioural model-based BIST may greatly simplify the test requirements.

Inspec keywords: system-on-chip; sigma-delta modulation; built-in self test

Other keywords: Σ Δ modulator test; embedded component testing; SoC; functionality integration; Σ Δ converter; behavioural model; test requirement; BIST

Subjects: A/D and D/A convertors