In this chapter uncertainty in the practice of mixed-signal VLSI testing is discussed. In spite of considerable efforts from the mid 1980s onwards, when mixed-signal ICs began to grow from manageable MSI size towards LSI and VLSI complexities, the subject still remains one of continuing development in both design techniques and testing strategies and, most importantly, in appropriate hardware and software CAD resources to assist in this area. Mixed-signal design for testability is therefore still considered to be the most challenging area of present-day microelectronic circuit and system design.
Mixed analogue/digital system test, Page 1 of 2
< Previous page Next page > /docserver/preview/fulltext/books/cs/pbcs009e/PBCS009E_ch8-1.gif /docserver/preview/fulltext/books/cs/pbcs009e/PBCS009E_ch8-2.gif