In this chapter uncertainty in the practice of mixed-signal VLSI testing is discussed. In spite of considerable efforts from the mid 1980s onwards, when mixed-signal ICs began to grow from manageable MSI size towards LSI and VLSI complexities, the subject still remains one of continuing development in both design techniques and testing strategies and, most importantly, in appropriate hardware and software CAD resources to assist in this area. Mixed-signal design for testability is therefore still considered to be the most challenging area of present-day microelectronic circuit and system design.

Inspec keywords: analogue integrated circuits; digital integrated circuits; integrated circuit design; VLSI; integrated circuit testing; mixed analogue-digital integrated circuits; circuit complexity; design for testability

Other keywords: hardware resources; software CAD resource; design for testability; microelectronic circuit design; mixed analogue-digital system test; VLSI circuit complexity; mixed-signal IC design; mixed-signal VLSI testing; microelectronic system design

Subjects: Mixed analogue-digital circuits