In this chapter we will consider particular circuits and circuit architectures, and how they may be tested. The fundamental principles of digital logic testing will still be relevant, but specific fault mechanisms, circuit failures and/or testing procedures may now be involved. Additionally, many of the required test procedures will have been considered in detail by the IC manufacture (vendor), and therefore the OEM will not have the problem of formulating tests for such circuits from scratch as may be necessary with a system assembly of simpler ICs or other components-the problem of accessibility of the I/Os of such circuits for test purposes in a completed system assembly will, of course, still be present.

Inspec keywords: logic testing; microprocessor chips; integrated circuit testing; fault simulation

Other keywords: microprocessors; circuit architectures; fault mechanisms; test purposes; circuit failures; testing procedures; structured digital circuit testing; IC manufacture; digital logic testing; system assembly

Subjects: Microprocessors and microcomputers